E.E. Flater, G.E. Zacharakis-Jutz*, B.G. Dumba*, I.A. White*, C.A. Clifford, "Toward Easy and Reliable AFM Tip Shape Determination using Blind Tip Reconstruction," Ultramicroscopy 146 (2014) p.130-143. Available online.
*Undergraduate co-authors

E.E. Flater, W.R. Ashurst, R.W. Carpick, "Nanotribology of octadecyltrichlorosilane monolayers and silicon: Self-mated vs. unmated interfaces and local packing density effects," Lanmguir 23 (2007) p.9242-9252. Available online.

E.E. Flater, A.D. Corwin, M.P. de Boer, R.W. Carpick, “In-situ wear studies of surface micromachined interfaces subject to controlled loading,” Wear 260, 6 (2006) p.580-593. Available online.

D.S. Grierson, E.E. Flater, R.W. Carpick, “The JKR-DMT transition as applied to Atomic Force Microscopy measurements," Journal of Adhesion Science and Technology 19, 3–5 (2005) p. 291–311. Available online.

C.K. Bora, E.E. Flater, M.D. Street, J.M. Redmond, M.J. Starr, R.W. Carpick, M.E. Plesha, “Multiscale Roughness and Modeling of MEMS Interfaces,” Tribology Letters 19, 1 (2005) p.37-48. Available online.

R.W. Carpick, E.E. Flater, K. Sridharan, D.F. Ogletree, M. Salmeron, "Atomic scale friction and its connections to fracture mechanics," JoM 56,10 (2004) p.48-52. Available online.